Texas Instruments
Texas Instruments Incorporated (TI) is a global semiconductor powerhouse, crafts advanced analog ICs and embedded processors. Fueled by top-tier minds, TI's innovations drive tech's future, impacting 100,000+ clients.
View All Product from Texas InstrumentsThe SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas InstrumentsSCOPE testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry isaccomplished via the 4-wire test access port (TAP) interface.In the normal mode, this device is an 18-bit universal bus transceiver that combines D-type latches and D-typeflip-flops to allow data flow in transparent, latched, or clocked modes. It can be used either as two 9-bittransceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samplesof the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAPin the normal mode does not affect the functional operation of the SCOPE universal bus transceiver.Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA),and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode whenLEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level.Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB is low, theB outputs are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow issimilar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs.In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited and the testcircuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitryperforms boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test dataoutput (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testingfunctions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.Additional flexibility is provided in the test mode through the use of two boundary-scan cells (BSCs) for eachI/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNTinstruction also is included to ease the testing of memories and other circuits where a binary count addressingscheme is useful.The SN54ABT18502 is characterized for operation over the full military temperature range of – 55°C to 125°C.
TYPE | DESCRIPTION | Select all |
---|---|---|
Package | Tube | |
Series | 54ABT | |
Supplier Device Package | - | |
Package / Case | - | |
Mounting Type | Surface Mount | |
Operating Temperature | -55°C ~ 125°C | |
Number of Bits | 18 | |
Supply Voltage | 4.5V ~ 5.5V | |
Logic Type | Scan Test Device with Registered Bus Transceiver | |
Product Status | Active |
Texas Instruments
Texas Instruments Incorporated (TI) is a global semiconductor powerhouse, crafts advanced analog ICs and embedded processors. Fueled by top-tier minds, TI's innovations drive tech's future, impacting 100,000+ clients.
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