DS2174QN

DS2174QN

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DS2174QN
ENHANCED BIT ERROR RATE TESTER
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$20.67

Price update:a months ago
Available in stock: 728
45
Serves customers in 45 countries
1000+
Worldwide Manufacturers
$140M
$140M Growth in 5 Years
50.0M+
50M Parts Shipped in 5 Years
Analog Devices Inc./Maxim Integrated

Analog Devices Inc./Maxim Integrated

Maxim Integrated has amalgamated with Analog Devices, imparting an augmented repertoire of superlative mixed-signal and power governance innovations, fostering clientele triumph across diverse sectors. This amalgamation begets a spectrum of resolutions for surmounting the utmost intricate quandaries, spanning from direct current to the expanse of 100 gigahertz, encompassing miniscule nanowatt realms to robust kilowatt domains, spanning the sensor continuum to the ethereal expanse of cloud. Delve deeper into Analog Devices' enriched assemblage on their product dossier.

View All Product from Analog Devices Inc./Maxim Integrated
DS2174QN Products

The DS2174QN enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.

APPLICATIONS
■ Routers
■ Channel Service Units (CSUs)
■ Data Service Units (DSUs)
■ Muxes
■ Switches
■ Digital-to-Analog Converters (DACs)
■ CPE Equipment
■ Bridges
■ Smart Jack

Feature

■ Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems■ Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path■ Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length■ Large 48-bit count and bit error count registers■ Software-programmable bit error insertion■ Fully independent transmit and receive paths■ 8-bit parallel-control port■ Detects polynomial test patterns in the presence of bit error rates up to 10-2■ Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces■ Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3■ Available in 44-pin PLCC

Product Attributes

TYPE DESCRIPTION Select all
Function Enhanced Bit Error Rate Tester (EBERT)
Package / Case 44-LCC (J-Lead)
Mounting Type Surface Mount
Operating Temperature -40°C ~ 85°C
Current - Supply 60mA
Voltage - Supply 3V ~ 3.6V
Number of Circuits 1
Interface Parallel
Product Status Active
Package Bulk
Supplier Device Package 44-PLCC (16.59x16.59)

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$20.67

Price update:a months ago
Available in stock: 728
Analog Devices Inc./Maxim Integrated

Analog Devices Inc./Maxim Integrated

Maxim Integrated has amalgamated with Analog Devices, imparting an augmented repertoire of superlative mixed-signal and power governance innovations, fostering clientele triumph across diverse sectors. This amalgamation begets a spectrum of resolutions for surmounting the utmost intricate quandaries, spanning from direct current to the expanse of 100 gigahertz, encompassing miniscule nanowatt realms to robust kilowatt domains, spanning the sensor continuum to the ethereal expanse of cloud. Delve deeper into Analog Devices' enriched assemblage on their product dossier.

View All Product from Analog Devices Inc./Maxim Integrated

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