SN74LVC1G08MDBVREP

SN74LVC1G08MDBVREP

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SN74LVC1G08MDBVREP
IC GATE AND 1CH 2-INP SOT23-5
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$0.76

Price update:a months ago
Available in stock: 20000
45
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50M Parts Shipped in 5 Years
Texas Instruments

Texas Instruments

Texas Instruments Incorporated (TI) is a global semiconductor powerhouse, crafts advanced analog ICs and embedded processors. Fueled by top-tier minds, TI's innovations drive tech's future, impacting 100,000+ clients.

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SN74LVC1G08MDBVREP Products

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74LVC1G08MDBVREP performs the Boolean function Y = A ? B or Y = A\ + B\in positive logic.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Feature

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Supports 5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 3.6 ns at 3.3 V
  • Low Power Consumption, 10-μA Max ICC
  • ±24-mA Output Drive at 3.3 V
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74LVC1G08 performs the Boolean function Y = A ? B or Y = A\ + B\in positive logic.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Product Attributes

TYPE DESCRIPTION Select all
Operating Temperature -55°C ~ 125°C
Current - Output High, Low 32mA, 32mA
Current - Quiescent (Max) 10 µA
Voltage - Supply 1.65V ~ 5.5V
Number of Inputs 2
Package / Case SC-74A, SOT-753
Number of Circuits 1
Supplier Device Package SOT-23-5
Logic Type AND Gate
Mounting Type Surface Mount
Series 74LVC
Max Propagation Delay @ V, Max CL 5ns @ 5V, 50pF
Product Status Active
Package Tape & Reel (TR)

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$0.76

Price update:a months ago
Available in stock: 20000
Texas Instruments

Texas Instruments

Texas Instruments Incorporated (TI) is a global semiconductor powerhouse, crafts advanced analog ICs and embedded processors. Fueled by top-tier minds, TI's innovations drive tech's future, impacting 100,000+ clients.

View All Product from Texas Instruments

Blog